Probing three-dimensional surface force fields with atomic resolution: measurement strategies, limitations, and artifact reduction

Simple item page
dc.citation.epage650en_US
dc.citation.issueNumber1en_US
dc.citation.spage637en_US
dc.citation.volumeNumber3en_US
dc.contributor.authorBaykara, M. Z.en_US
dc.contributor.authorDagdeviren, O. E.en_US
dc.contributor.authorSchwendemann, T. C.en_US
dc.contributor.authorMönig, H.en_US
dc.contributor.authorAltman, E. I.en_US
dc.contributor.authorSchwarz, U. D.en_US
dc.date.accessioned2016-02-08T09:44:46Z
dc.date.available2016-02-08T09:44:46Z
dc.date.issued2012en_US
dc.departmentDepartment of Mechanical Engineeringen_US
dc.description.abstractNoncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic deformation of the tip apex, these effects need to be considered during image interpretation. In this paper, we analyze their impact on the acquired data, compare different methods to record atomic-resolution surface force fields, and determine the approaches that suffer the least from the associated artifacts. The related discussion underscores the idea that since force fields recorded by using NC-AFM always reflect the properties of both the sample and the probe tip, efforts to reduce unwanted effects of the tip on recorded data are indispensable for the extraction of detailed information about the atomicscale properties of the surface. © 2012 Baykara et al.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T09:44:46Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2012en
dc.identifier.doi10.3762/bjnano.3.73en_US
dc.identifier.eissn2190-4286
dc.identifier.urihttp://hdl.handle.net/11693/21324
dc.language.isoEnglishen_US
dc.publisherBeilstein - Institut zur Foerderung der Chemischen Wissenschaftenen_US
dc.relation.isversionofhttp://dx.doi.org/10.3762/bjnano.3.73en_US
dc.source.titleBeilstein Journal of Nanotechnologyen_US
dc.titleProbing three-dimensional surface force fields with atomic resolution: measurement strategies, limitations, and artifact reductionen_US
dc.typeArticleen_US

Files

Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
Probing three-dimensional surface force fields with atomic resolution Measurement strategies, limitations, and artifact reduction.pdf
Size:
8.54 MB
Format:
Adobe Portable Document Format
Description:
Full printable version
Download

Collections

Scholarly Publications - Mechanical Engineering