A near-infrared range photodetector based on indium nitride nanocrystals obtained through laser ablation
buir.contributor.author | Bıyıklı, Necmi | |
buir.contributor.author | Okyay, Ali Kemal | |
dc.citation.epage | 938 | en_US |
dc.citation.issueNumber | 9 | en_US |
dc.citation.spage | 936 | en_US |
dc.citation.volumeNumber | 35 | en_US |
dc.contributor.author | Tekcan, B. | en_US |
dc.contributor.author | Alkis, S. | en_US |
dc.contributor.author | Alevli, M. | en_US |
dc.contributor.author | Dietz, N. | en_US |
dc.contributor.author | Ortac, B. | en_US |
dc.contributor.author | Bıyıklı, Necmi | en_US |
dc.contributor.author | Okyay, Ali Kemal | en_US |
dc.date.accessioned | 2016-02-08T10:59:12Z | |
dc.date.available | 2016-02-08T10:59:12Z | |
dc.date.issued | 2014 | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.description.abstract | We present a proof-of-concept photodetector that is sensitive in the near-infrared (NIR) range based on InN nanocrystals. Indium nitride nanocrystals (InN-NCs) are obtained through laser ablation of a high pressure chemical vapor deposition grown indium nitride thin film and are used as optically active absorption region. InN-NCs are sandwiched between thin insulating films to reduce the electrical leakage current. Under-1 V applied bias, the recorded photoresponsivity values within 600-1100-nm wavelength range are as high as (3.05 × 10-2) mA/W. An ultrathin layer of nanocrystalline InN thin film is, therefore, a promising candidate for NIR detection in large area schemes. © 2014 IEEE. | en_US |
dc.description.provenance | Made available in DSpace on 2016-02-08T10:59:12Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2014 | en |
dc.identifier.doi | 10.1109/LED.2014.2336795 | en_US |
dc.identifier.issn | 0741-3106 | |
dc.identifier.uri | http://hdl.handle.net/11693/26395 | |
dc.language.iso | English | en_US |
dc.publisher | IEEE | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1109/LED.2014.2336795 | en_US |
dc.source.title | IEEE Electron Device Letters | en_US |
dc.subject | indium nitride | en_US |
dc.subject | nanocrystals | en_US |
dc.subject | near-infrared (NIR) | en_US |
dc.subject | Photodetector | en_US |
dc.subject | Chemical vapor deposition | en_US |
dc.subject | Laser ablation | en_US |
dc.subject | Nanocrystals | en_US |
dc.subject | Photodetectors | en_US |
dc.subject | Photons | en_US |
dc.subject | Thin films | en_US |
dc.subject | Electrical leakage | en_US |
dc.subject | High pressure chemical vapor deposition | en_US |
dc.subject | Indium nitride | en_US |
dc.subject | Near infra red | en_US |
dc.subject | Near-infrared range | en_US |
dc.subject | Photoresponsivity | en_US |
dc.subject | Thin insulating film | en_US |
dc.subject | Wavelength ranges | en_US |
dc.subject | Infrared devices | en_US |
dc.title | A near-infrared range photodetector based on indium nitride nanocrystals obtained through laser ablation | en_US |
dc.type | Article | en_US |
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