A near-infrared range photodetector based on indium nitride nanocrystals obtained through laser ablation
Date
2014
Editor(s)
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
BUIR Usage Stats
4
views
views
27
downloads
downloads
Citation Stats
Series
Abstract
We present a proof-of-concept photodetector that is sensitive in the near-infrared (NIR) range based on InN nanocrystals. Indium nitride nanocrystals (InN-NCs) are obtained through laser ablation of a high pressure chemical vapor deposition grown indium nitride thin film and are used as optically active absorption region. InN-NCs are sandwiched between thin insulating films to reduce the electrical leakage current. Under-1 V applied bias, the recorded photoresponsivity values within 600-1100-nm wavelength range are as high as (3.05 × 10-2) mA/W. An ultrathin layer of nanocrystalline InN thin film is, therefore, a promising candidate for NIR detection in large area schemes. © 2014 IEEE.
Source Title
IEEE Electron Device Letters
Publisher
IEEE
Course
Other identifiers
Book Title
Keywords
indium nitride, nanocrystals, near-infrared (NIR), Photodetector, Chemical vapor deposition, Laser ablation, Nanocrystals, Photodetectors, Photons, Thin films, Electrical leakage, High pressure chemical vapor deposition, Indium nitride, Near infra red, Near-infrared range, Photoresponsivity, Thin insulating film, Wavelength ranges, Infrared devices
Degree Discipline
Degree Level
Degree Name
Citation
Permalink
Published Version (Please cite this version)
Language
English