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  2. Engineering
  3. Department of Electrical and Electronics Engineering
  4. Scholarly Publications - Electrical and Electronics Engineering
  5. Microscopic image classification via WT-based covariance descriptors using Kullback-Leibler distance
 

Microscopic image classification via WT-based covariance descriptors using Kullback-Leibler distance

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Microscopic image classification via WT-based covariance descriptors using Kullback-Leibler distance.pdf (1.21 MB)

Date

2012

Authors

Keskin, Furkan
Çetin, A. Enis
Erşahin, Tülin
Çetin-Atalay, Rengül

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Abstract

Source Title

ISCAS 2012 - 2012 IEEE International Symposium on Circuits and Systems

Publisher

IEEE

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Keywords

Bayesian classification, Cancer cell lines, Carcinoma cell lines, Carcinoma cells, Classification framework, Covariance matrices, Descriptors, Dissimilarity measures, Dual-tree complex wavelet transform, KL-divergence, Kullback-Leibler distance, Kullback-Leibler divergence, Microscopic image, Multiple orientations, Region covariance matrixes, Shift invariance, Cell culture, Covariance matrix, Eigenvalues and eigenfunctions, Feature extraction, Image classification, Pixels

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Citation

Permalink

http://hdl.handle.net/11693/28162

Published Version (Please cite this version)

http://dx.doi.org/10.1109/ISCAS.2012.6271692

Collections

Scholarly Publications - Electrical and Electronics Engineering

Language

English

Type

Conference Paper
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