3D Force field spectroscopy

Simple item page
dc.citation.epage28en_US
dc.citation.spage9en_US
dc.citation.volumeNumber3en_US
dc.contributor.authorBaykara, Mehmet Z.en_US
dc.contributor.authorSchwarz, U. D.en_US
dc.contributor.editorMorita, S.
dc.contributor.editorGiessibl, F. J.
dc.contributor.editorMeyer, E.
dc.contributor.editorWiesendanger, R.
dc.date.accessioned2019-04-22T08:28:36Z
dc.date.available2019-04-22T08:28:36Z
dc.date.issued2015en_US
dc.departmentDepartment of Mechanical Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.descriptionChapter 2en_US
dc.description.abstractWith recent advances in instrumentation and experimental methodology, noncontact atomic force microscopy is now being frequently used to measure the atomic-scale interactions acting between a sharp probe tip and surfaces of interest as a function of three spatial dimensions, via the method of three-dimensional atomic force microscopy (3D-AFM). In this chapter, we discuss the different data collection and processing approaches taken towards this goal while highlighting the associated advantages and disadvantages in terms of correct interpretation of results. Additionally, common sources of artifacts in 3D-AFM measurements, including thermal drift, piezo nonlinearities, and tip-related issues such as asymmetry and elasticity are considered. Finally, the combination of 3D-AFM with simultaneous scanning tunneling microscopy (STM) is illustrated on surface-oxidized Cu(100). We conclude the chapter by an outlook regarding the future development of the 3D-AFM method.en_US
dc.description.provenanceSubmitted by Onur Emek (onur.emek@bilkent.edu.tr) on 2019-04-22T08:28:36Z No. of bitstreams: 1 3D_Force_Field_Spectroscopy.pdf: 881388 bytes, checksum: 80d42760bd152e954db17da9f169504d (MD5)en
dc.description.provenanceMade available in DSpace on 2019-04-22T08:28:36Z (GMT). No. of bitstreams: 1 3D_Force_Field_Spectroscopy.pdf: 881388 bytes, checksum: 80d42760bd152e954db17da9f169504d (MD5) Previous issue date: 2015en
dc.identifier.doi10.1007/978-3-319-15588-3_2en_US
dc.identifier.doi10.1007/978-3-319-15588-3en_US
dc.identifier.eissn2197-7127
dc.identifier.isbn9783319155876
dc.identifier.issn1434-4904
dc.identifier.urihttp://hdl.handle.net/11693/50865
dc.language.isoEnglishen_US
dc.publisherSpringer, Chamen_US
dc.relation.ispartofNoncontact atomic force microscopyen_US
dc.relation.ispartofseriesNanoScience and Technology;
dc.relation.isversionofhttps://doi.org/10.1007/978-3-319-15588-3_2en_US
dc.relation.isversionofhttps://doi.org/10.1007/978-3-319-15588-3en_US
dc.subjectScanning tunneling microscopeen_US
dc.subjectDrift rateen_US
dc.subjectScanning probe microscopyen_US
dc.subjectTunneling currenten_US
dc.subjectHighly orient pyrolytic graphiteen_US
dc.title3D Force field spectroscopyen_US
dc.typeBook Chapteren_US

Files

Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
3D_Force_Field_Spectroscopy.pdf
Size:
860.73 KB
Format:
Adobe Portable Document Format
Description:
View / Download
Download
License bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed upon to submission
Description:
Download

Collections

Scholarly Publications - Mechanical Engineering