XPS investigation of X-ray-induced reduction of metal ions

dc.citation.epage1718en_US
dc.citation.issueNumber11en_US
dc.citation.spage1716en_US
dc.citation.volumeNumber54en_US
dc.contributor.authorSüzer, Ş.en_US
dc.date.accessioned2016-02-08T10:37:17Z
dc.date.available2016-02-08T10:37:17Z
dc.date.issued2000en_US
dc.departmentDepartment of Chemistryen_US
dc.description.abstractAn overview is given on the reduction by X-rays, of Au, Hg, Bl, V, and W metal ions during the XPS analysis of various kinds of samples. The possibility of correlating the ability of the metal ions to undergo X-ray induced reduction with their electrochemical reduction potentials is also highlighted.en_US
dc.identifier.doi10.1366/0003702001948772en_US
dc.identifier.issn0003-7028
dc.identifier.urihttp://hdl.handle.net/11693/24984
dc.language.isoEnglishen_US
dc.publisherSage Publications, Inc.en_US
dc.relation.isversionofhttp://dx.doi.org/10.1366/0003702001948772en_US
dc.source.titleApplied Spectroscopyen_US
dc.subjectX-ray-induced reduction of Au31, Hg21, Bi31 , V51 and W61en_US
dc.subjectElectrochemical reduction potentiaen_US
dc.subjectXPSen_US
dc.titleXPS investigation of X-ray-induced reduction of metal ionsen_US
dc.typeArticleen_US

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