XPS investigation of X-ray-induced reduction of metal ions

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Abstract

An overview is given on the reduction by X-rays, of Au, Hg, Bl, V, and W metal ions during the XPS analysis of various kinds of samples. The possibility of correlating the ability of the metal ions to undergo X-ray induced reduction with their electrochemical reduction potentials is also highlighted.

Source Title

Applied Spectroscopy

Publisher

Sage Publications, Inc.

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Citation

Published Version (Please cite this version)

Language

English