Linear measurements of nanomechanical phenomena using small-amplitude AFM

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dc.citation.epage12en_US
dc.citation.spage7en_US
dc.citation.volumeNumber838en_US
dc.contributor.authorHoffmann, P. M.en_US
dc.contributor.authorPatil, S.en_US
dc.contributor.authorMatei, G.en_US
dc.contributor.authorTanülkü, A.en_US
dc.contributor.authorGrimble, R.en_US
dc.contributor.authorÖzer, Ö.en_US
dc.contributor.authorJeffery, S.en_US
dc.contributor.authorOral, Ahmeten_US
dc.contributor.authorPethica, J.en_US
dc.coverage.spatialBoston, Massachusetts, USAen_US
dc.date.accessioned2016-02-08T11:52:43Zen_US
dc.date.available2016-02-08T11:52:43Zen_US
dc.date.issued2004en_US
dc.departmentDepartment of Physicsen_US
dc.descriptionDate of Conference: 29 November-3 December 2004en_US
dc.descriptionConference Name: 2004 MRS Fall Meeting, 2004en_US
dc.description.abstractDynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T11:52:43Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2004en
dc.identifier.doihttps://doi.org/10.1557/PROC-838-O1.8en_US
dc.identifier.doi10.1557/PROC-838-O1.8en_US
dc.identifier.issn0272-9172en_US
dc.identifier.urihttp://hdl.handle.net/11693/27411en_US
dc.language.isoEnglishen_US
dc.publisherMaterials Research Societyen_US
dc.relation.isversionofhttps://doi.org/10.1557/PROC-838-O1.8en_US
dc.source.titleSymposium O – Scanning Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materialsen_US
dc.subjectAtom bondingen_US
dc.subjectLiquid layersen_US
dc.subjectMolecular orderingen_US
dc.subjectAtomic force microscopyen_US
dc.subjectChemical bondsen_US
dc.subjectMolecular interactionsen_US
dc.subjectMolecular orientationen_US
dc.subjectNanostructured materialsen_US
dc.subjectUltrahigh vacuumen_US
dc.subjectNanomechanicsen_US
dc.titleLinear measurements of nanomechanical phenomena using small-amplitude AFMen_US
dc.typeConference Paperen_US

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