Linear measurements of nanomechanical phenomena using small-amplitude AFM

Date
2004
Advisor
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Source Title
Symposium O – Scanning Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials
Print ISSN
0272-9172
Electronic ISSN
Publisher
Materials Research Society
Volume
838
Issue
Pages
7 - 12
Language
English
Type
Conference Paper
Journal Title
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Abstract

Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water.

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Keywords
Atom bonding, Liquid layers, Molecular ordering, Atomic force microscopy, Chemical bonds, Molecular interactions, Molecular orientation, Nanostructured materials, Ultrahigh vacuum, Nanomechanics
Citation
Published Version (Please cite this version)