Microwave whispering-gallery-mode photoconductivity measurement of recombination lifetime in silicon

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buir.contributor.authorAltıntaş, Ayhan
dc.citation.epage107en_US
dc.citation.issueNumber2en_US
dc.citation.spage101en_US
dc.citation.volumeNumber8en_US
dc.contributor.authorYurchenko, V.en_US
dc.contributor.authorNavruz, T.en_US
dc.contributor.authorÇiydem, M.en_US
dc.contributor.authorAltıntaş, Ayhanen_US
dc.date.accessioned2020-02-13T10:11:35Z
dc.date.available2020-02-13T10:11:35Z
dc.date.issued2019
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractWe present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetime in highresistivity semiconductor layers. We applied the method to undoped Silicon wafers of high resistivity at 5 and 30 kOhm*cm and measured the conductivity relaxation times of 10 and 14 microseconds, respectively. In wafers being considered, they are supposed to be defined by the electron-hole diffusion from the bulk to the wafer surfaces.en_US
dc.description.provenanceSubmitted by Zeynep Aykut (zeynepay@bilkent.edu.tr) on 2020-02-13T10:11:35Z No. of bitstreams: 1 Microwave_whispering_gallery_mode_photoconductivity_measurement_of_recombination_lifetime_in_silicon.pdf: 2658245 bytes, checksum: 6ab450fa77368daf74e90992f5535bd4 (MD5)en
dc.description.provenanceMade available in DSpace on 2020-02-13T10:11:35Z (GMT). No. of bitstreams: 1 Microwave_whispering_gallery_mode_photoconductivity_measurement_of_recombination_lifetime_in_silicon.pdf: 2658245 bytes, checksum: 6ab450fa77368daf74e90992f5535bd4 (MD5) Previous issue date: 2019en
dc.identifier.doi10.7716/aem.v8i2.1127en_US
dc.identifier.issn2119-0275
dc.identifier.urihttp://hdl.handle.net/11693/53333
dc.language.isoEnglishen_US
dc.publisherAdvanced Electromagneticsen_US
dc.relation.isversionofhttps://dx.doi.org/10.7716/aem.v8i2.1127en_US
dc.source.titleAdvanced Electromagneticsen_US
dc.subjectSiliconen_US
dc.subjectRecombination lifetimeen_US
dc.subjectPhotoconductivityen_US
dc.subjectPhotoconductivity-decay methoden_US
dc.subjectElectron-hole diffusionen_US
dc.subjectWhispering-gallery-modeen_US
dc.titleMicrowave whispering-gallery-mode photoconductivity measurement of recombination lifetime in siliconen_US
dc.typeArticleen_US

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