Colorimetric detection of ultrathin dielectrics on strong interference coatings

dc.citation.epage1382en_US
dc.citation.issueNumber6en_US
dc.citation.spage1379en_US
dc.citation.volumeNumber43en_US
dc.contributor.authorAyas S.en_US
dc.contributor.authorBakan, G.en_US
dc.contributor.authorOzgur E.en_US
dc.contributor.authorCelebi, K.en_US
dc.contributor.authorTorunoglu, G.en_US
dc.contributor.authorDana, A.en_US
dc.date.accessioned2019-02-21T16:07:55Zen_US
dc.date.available2019-02-21T16:07:55Zen_US
dc.date.issued2018en_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.description.abstractMetal films covered with ultrathin lossy dielectrics can exhibit strong interference effects manifested as the broad absorption of the incident light resulting in distinct surface colors. Despite their simple bilayer structures, such surfaces have only recently been scrutinized and applied mainly to color printing. Here, we report the use of such surfaces for colorimetric detection of ultrathin dielectrics. Upon deposition of a nanometer-thick dielectric on the surface, the absorption peak red shifts, changing the surface color. The color contrast between the bare and dielectric-coated surfaces can be detected by the naked eye. The optical responses of the surfaces are characterized for nanometer-thick SiO2, Al2O3, and bovine serum albumin molecules. The results suggest that strong interference surfaces can be employed as biosensors.en_US
dc.description.provenanceMade available in DSpace on 2019-02-21T16:07:55Z (GMT). No. of bitstreams: 1 Bilkent-research-paper.pdf: 222869 bytes, checksum: 842af2b9bd649e7f548593affdbafbb3 (MD5) Previous issue date: 2018en_US
dc.identifier.doi10.1364/OL.43.001379en_US
dc.identifier.eissn1539-4794en_US
dc.identifier.issn0146-9592en_US
dc.identifier.urihttp://hdl.handle.net/11693/50389en_US
dc.language.isoEnglishen_US
dc.publisherOSA - The Optical Societyen_US
dc.relation.isversionofhttps://doi.org/10.1364/OL.43.001379en_US
dc.source.titleOptics Lettersen_US
dc.titleColorimetric detection of ultrathin dielectrics on strong interference coatingsen_US
dc.typeArticleen_US

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