Position-invariant surface recognition and localization using infrared sensors

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dc.citation.epage3594en_US
dc.citation.issueNumber12en_US
dc.citation.spage3589en_US
dc.citation.volumeNumber42en_US
dc.contributor.authorBarshan, B.en_US
dc.contributor.authorAytaç, T.en_US
dc.date.accessioned2016-02-08T10:28:37Z
dc.date.available2016-02-08T10:28:37Z
dc.date.issued2003en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractLow-cost infrared emitters and detectors are used for the recognition of surfaces with different properties in a location-invariant manner. The intensity readings obtained with such devices are highly dependent on the location and properties of the surface in a way that cannot be represented in a simple manner, complicating the recognition and localization process. We propose the use of angular intensity scans and present an algorithm to process them. This approach can distinguish different surfaces independently of their positions. Once the surface is identified, its position can also be estimated. The method is verified experimentally with the surfaces aluminum, white painted wall, brown kraft paper, and polystyrene foam packaging material. A correct differentiation rate of 87% is achieved, and the surfaces are localized within absolute range and azimuth errors of 1.2 cm and 1.0 deg, respectively. The method demonstrated shows that simple infrared sensors, when coupled with appropriate processing, can be used to extract a significantly greater amount of information than they are commonly employed for. © 2003 Society of Photo-Optical Instrumentation Engineers.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:28:37Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2003en
dc.identifier.doi10.1117/1.1621005en_US
dc.identifier.issn0091-3286
dc.identifier.urihttp://hdl.handle.net/11693/24390
dc.language.isoEnglishen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/1.1621005en_US
dc.source.titleOptical Engineeringen_US
dc.subjectAlgorithmsen_US
dc.subjectAluminumen_US
dc.subjectFeature extractionen_US
dc.subjectInfrared detectorsen_US
dc.subjectPolystyrenesen_US
dc.subjectSurfacesen_US
dc.subjectInfrared emittersen_US
dc.subjectInfrared sensorsen_US
dc.subjectPosition estimationen_US
dc.subjectSurface recognitionen_US
dc.subjectOptical sensorsen_US
dc.subjectPattern recognition and feature extractionen_US
dc.titlePosition-invariant surface recognition and localization using infrared sensorsen_US
dc.typeArticleen_US

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