Reliability-aware heterogeneous 3D chip multiprocessor design

dc.citation.epage184en_US
dc.citation.issueNumber2en_US
dc.citation.spage177en_US
dc.citation.volumeNumber29en_US
dc.contributor.authorAkturk, I.en_US
dc.contributor.authorOzturk, O.en_US
dc.date.accessioned2016-02-08T12:08:30Z
dc.date.available2016-02-08T12:08:30Z
dc.date.issued2013en_US
dc.departmentDepartment of Computer Engineeringen_US
dc.description.abstractAbility to stack separate chips in a single package enables three-dimensional integrated circuits (3D ICs). Heterogeneous 3D ICs provide even better opportunities to reduce the power and increase the performance per unit area. An important issue in designing a heterogeneous 3D IC is reliability. To achieve this, one needs to select the data mapping and processor layout carefully. This paper addresses this problem using an integer linear programming (ILP) approach. Specifically, on a heterogeneous 3D CMP, it explores how applications can be mapped onto 3D ICs to maximize reliability. Preliminary experiments indicate that the proposed technique generates promising results in both reliability and performance. © 2013 Springer Science+Business Media New York.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T12:08:30Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2013en
dc.identifier.doi10.1007/s10836-013-5373-0en_US
dc.identifier.issn0923-8174en_US
dc.identifier.urihttp://hdl.handle.net/11693/28017en_US
dc.language.isoEnglishen_US
dc.publisherSpringeren_US
dc.relation.isversionofhttp://dx.doi.org/10.1007/s10836-013-5373-0en_US
dc.source.titleJournal of Electronic Testing: theory and applicationsen_US
dc.subject3Den_US
dc.subjectData mappingen_US
dc.subjectMulticoreen_US
dc.subjectReliabilityen_US
dc.titleReliability-aware heterogeneous 3D chip multiprocessor designen_US
dc.typeArticleen_US

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