Reliability-aware heterogeneous 3D chip multiprocessor design

Date

2013

Authors

Akturk, I.
Ozturk, O.

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Source Title

Journal of Electronic Testing: theory and applications

Print ISSN

0923-8174

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Publisher

Springer

Volume

29

Issue

2

Pages

177 - 184

Language

English

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Abstract

Ability to stack separate chips in a single package enables three-dimensional integrated circuits (3D ICs). Heterogeneous 3D ICs provide even better opportunities to reduce the power and increase the performance per unit area. An important issue in designing a heterogeneous 3D IC is reliability. To achieve this, one needs to select the data mapping and processor layout carefully. This paper addresses this problem using an integer linear programming (ILP) approach. Specifically, on a heterogeneous 3D CMP, it explores how applications can be mapped onto 3D ICs to maximize reliability. Preliminary experiments indicate that the proposed technique generates promising results in both reliability and performance. © 2013 Springer Science+Business Media New York.

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