Electric breakdown in polycrystalline semiconductors with highly nonlinear I-V characteristics: Simulations for simple barrier height models
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1997
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Abstract
An extension of the Canessa and Nguyen binary model for the nonlinear current-voltage (I-V) characteristics of polycrystalline semiconductors, based on the electrical properties of individual grains, is presented. Simple analytical models for the nonuniform distribution of barrier heights at grain boundaries are assumed. The set of nonlinear Kirchhoff equations, that determine the macroscopic current across the specimen, and the nonlinearity coefficient α are solved numerically. The applied voltage dependence of the barrier height models gives α values reaching ≈ 50, indicating high nonlinearity as required by potential commercial applications. © Tübi̇tak.
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Turkish Journal of Physics
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Computer simulation, Current voltage characteristics, Electric breakdown, Electric currents, Grain boundaries, Mathematical models, Nonlinear equations, Numerical methods, Polycrystalline materials, Problem solving, Barrier height distribution, Barrier height model, Macroscopic current, Nonlinear current voltage characteristics, Nonlinear Kirchoff equation, Polycrystalline semiconductor, Semiconductor materials
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English