Low-frequency time-domain characterization for fast and reliable evaluation of microwave transistor performance

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Abstract

In this paper, we introduce the use of the low-frequency characterization of electron devices as an accurate and economical way to fast gather consistent data about the electron device performance at microwaves in the evaluation phase of new components, technologies and processes. © 2016 European Microwave Association.

Source Title

2016 11th European Microwave Integrated Circuits Conference (EuMIC)

Publisher

IEEE

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Citation

Published Version (Please cite this version)

Language

English