Low-frequency time-domain characterization for fast and reliable evaluation of microwave transistor performance

Date
2016
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2016 11th European Microwave Integrated Circuits Conference (EuMIC)
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IEEE
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41 - 44
Language
English
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Abstract

In this paper, we introduce the use of the low-frequency characterization of electron devices as an accurate and economical way to fast gather consistent data about the electron device performance at microwaves in the evaluation phase of new components, technologies and processes. © 2016 European Microwave Association.

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Published Version (Please cite this version)