Statistics for Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes
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| Simultaneous non-contact atomic force microscopy (nc-AFM) STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes.pdf | 3 |