Determination of the critical indium composition corresponding to the metal-insulator transition in InxGa1-xN (0.06 ≤ x ≤ 0.135) layers
buir.contributor.author | Özbay, Ekmel | |
buir.contributor.orcid | Özbay, Ekmel|0000-0003-2953-1828 | |
dc.citation.epage | 841 | en_US |
dc.citation.issueNumber | 3 | en_US |
dc.citation.spage | 838 | en_US |
dc.citation.volumeNumber | 10 | en_US |
dc.contributor.author | Yildiz, A. | en_US |
dc.contributor.author | Lisesivdin, S. B. | en_US |
dc.contributor.author | Tasli, P. | en_US |
dc.contributor.author | Özbay, Ekmel | en_US |
dc.contributor.author | Kasap, M. | en_US |
dc.date.accessioned | 2016-02-08T09:58:48Z | |
dc.date.available | 2016-02-08T09:58:48Z | |
dc.date.issued | 2009-10-13 | en_US |
dc.department | Nanotechnology Research Center (NANOTAM) | en_US |
dc.department | Department of Physics | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.description.abstract | The low-temperature conductivity of InxGa1-xN alloys (0.06 ≤ x ≤ 0.135) is analyzed as a function of indium composition (x). Although our InxGa1-xN alloys were on the metallic side of the metal-insulator transition, neither the Kubo-Greenwood nor Born approach were able to describe the transport properties of the InxGa1-xN alloys. In addition, all of the InxGa1-xN alloys took place below the Ioeffe-Regel regime with their low conductivities. The observed behavior is discussed in the framework of the scaling theory. With decreasing indium composition, a decrease in thermal activation energy is observed. For the metal-insulator transition, the critical indium composition is obtained as xc = 0.0543 for InxGa1-xN alloys. | en_US |
dc.description.provenance | Made available in DSpace on 2016-02-08T09:58:48Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2010 | en |
dc.identifier.doi | 10.1016/j.cap.2009.10.004 | en_US |
dc.identifier.issn | 1567-1739 | |
dc.identifier.uri | http://hdl.handle.net/11693/22337 | |
dc.language.iso | English | en_US |
dc.publisher | Elsevier | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1016/j.cap.2009.10.004 | en_US |
dc.source.title | Current Applied Physics | en_US |
dc.subject | Electronic transport | en_US |
dc.subject | InGaN | en_US |
dc.subject | MIT | en_US |
dc.title | Determination of the critical indium composition corresponding to the metal-insulator transition in InxGa1-xN (0.06 ≤ x ≤ 0.135) layers | en_US |
dc.type | Article | en_US |
Files
Original bundle
1 - 1 of 1
Loading...
- Name:
- Determination of the critical indium composition corresponding to the metal-insulator transition in InxGa1-xN (0.06 ≤ x ≤ 0.135) layers.pdf
- Size:
- 265.1 KB
- Format:
- Adobe Portable Document Format
- Description:
- Full printable version