Parametrically coupled multiharmonic force imaging
Date
2008
Authors
Abak, M. K.
Aktas, O.
Mammadov R.
Gürsel, I.
Dâna, A.
Editor(s)
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
BUIR Usage Stats
4
views
views
20
downloads
downloads
Citation Stats
Series
Abstract
We report use of nonlinear tip-sample interactions to parametrically convert the frequency components of periodic tip-sample interaction forces to frequencies where they can be resonantly detected. One flexural mode of a cantilever is used for tapping-mode imaging and another flexural mode is used for detection of forces converted in presence of an externally injected mechanical oscillation at the difference frequency of the detecting mode and a harmonic of the tapping mode. Material contrast in attractive and repulsive regimes are demonstrated on samples with polymethyl methacrylate patterns and with deoxyribonucleic acid strands on silicon. © 2008 American Institute of Physics.
Source Title
Applied Physics Letters
Publisher
AIP Publishing
Course
Other identifiers
Book Title
Keywords
Degree Discipline
Degree Level
Degree Name
Citation
Permalink
Published Version (Please cite this version)
Language
English