XPS and FTIR characterization of manganese ions deposited on alumina

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buir.contributor.authorSüzer, Şefik
dc.citation.epage22en_US
dc.citation.spage19en_US
dc.citation.volumeNumber482-483en_US
dc.contributor.authorKantcheva, M.en_US
dc.contributor.authorKucukkal, M. U.en_US
dc.contributor.authorSüzer, Şefiken_US
dc.date.accessioned2015-07-28T11:56:25Z
dc.date.available2015-07-28T11:56:25Z
dc.date.issued1999-05-25en_US
dc.departmentDepartment of Chemistryen_US
dc.description.abstractBy application of XPS and FTIR spectroscopy of adsorbed CO the effect of preparation conditions on the state and localization of manganese ions deposited on h-Al2O3 is studied. Both Mn21 and Mn31 ions are observed on the impregnated sample. The sample obtained by ion exchange contains only Mn31 ions. The adsorbed CO species are identified. q 1999 Elsevier Science B.V. All rights reserved.en_US
dc.description.provenanceMade available in DSpace on 2015-07-28T11:56:25Z (GMT). No. of bitstreams: 1 10.1016-S0022-2860(98)00834-5.pdf: 105823 bytes, checksum: 6af2f3f9356b717b337f62ef27648b4a (MD5)en
dc.identifier.doi10.1016/S0022-2860(98)00834-5en_US
dc.identifier.issn0022-2860
dc.identifier.urihttp://hdl.handle.net/11693/10962
dc.language.isoEnglishen_US
dc.publisherElsevieren_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/S0022-2860(98)00834-5en_US
dc.source.titleJournal of Molecular Structureen_US
dc.subjectManganese on aluminaen_US
dc.subjectXPSen_US
dc.subjectFTIR of adsorbed COen_US
dc.titleXPS and FTIR characterization of manganese ions deposited on aluminaen_US
dc.typeArticleen_US

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