XPS and FTIR characterization of manganese ions deposited on alumina

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10.1016-S0022-2860(98)00834-5.pdf (103.34 KB)

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1999-05-25

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Abstract

By application of XPS and FTIR spectroscopy of adsorbed CO the effect of preparation conditions on the state and localization of manganese ions deposited on h-Al2O3 is studied. Both Mn21 and Mn31 ions are observed on the impregnated sample. The sample obtained by ion exchange contains only Mn31 ions. The adsorbed CO species are identified. q 1999 Elsevier Science B.V. All rights reserved.

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Journal of Molecular Structure

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Elsevier

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Manganese on alumina, XPS, FTIR of adsorbed CO

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http://hdl.handle.net/11693/10962

Published Version (Please cite this version)

http://dx.doi.org/10.1016/S0022-2860(98)00834-5

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Scholarly Publications - Chemistry

Language

English

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Article