Electrical and chemical characterization of chemically passivated silicon surfaces

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Electrical and chemical characterization of chemically passivated silicon surfaces.pdf (2.97 MB)

Date

2008

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Proceedings of the 33rd IEEE Photovoltaic Specialists Conference, IEEE 2008

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0160-8371

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IEEE

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English

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Conference Paper

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Abstract

The surface composition of chemically passivated silicon substrates is investigated using XPS and FTIR techniques. The samples are passivated with methanol, quinhydrone-methanol and iodine-methanol solution after HF treatment. The minority carrier lifetimes of these chemically passivated silicon substrates are also measured. Quinhydrone-methanol solution provides a chemically inert surface and a considerably longer minority carrier lifetime.

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Chemical characterization, Ftir techniques, HF treatment, Inert surfaces, Minority carrier lifetimes, Silicon substrates, Silicon surfaces, Methanol, Passivation

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http://hdl.handle.net/11693/26807

Published Version (Please cite this version)

http://dx.doi.org/10.1109/PVSC.2008.4922673

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Scholarly Publications - Chemistry