Probing the charge build-up and dissipation on thin PMMA film surfaces at the molecular level by XPS
| buir.contributor.author | Süzer, Şefik | |
| dc.citation.epage | 5492 | en_US |
| dc.citation.issueNumber | 22 | en_US |
| dc.citation.spage | 5488 | en_US |
| dc.citation.volumeNumber | 51 | en_US |
| dc.contributor.author | Yilmaz, E. | en_US |
| dc.contributor.author | Sezen, H. | en_US |
| dc.contributor.author | Süzer, Şefik | en_US |
| dc.date.accessioned | 2016-02-08T09:46:40Z | |
| dc.date.available | 2016-02-08T09:46:40Z | |
| dc.date.issued | 2012 | en_US |
| dc.department | Department of Chemistry | en_US |
| dc.description.abstract | What's the charge? X‐ray photoelectron spectroscopy was used to determine the charge state and dynamics of charge build‐up and decay on a thin poly(methyl methacrylate) film. The film is initially negatively charged to around −2 V and becomes progressively positively charged during the course of the XPS analysis. | en_US |
| dc.identifier.doi | 10.1002/anie.201201351 | en_US |
| dc.identifier.eissn | 1521-3773 | |
| dc.identifier.issn | 1433-7851 | |
| dc.identifier.uri | http://hdl.handle.net/11693/21462 | |
| dc.language.iso | English | en_US |
| dc.publisher | Wiley | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1002/anie.201201351 | en_US |
| dc.source.title | Angewandte Chemie - International Edition | en_US |
| dc.title | Probing the charge build-up and dissipation on thin PMMA film surfaces at the molecular level by XPS | en_US |
| dc.type | Article | en_US |
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