Noncontact atomic force microscopy II
dc.citation.epage | 290 | en_US |
dc.citation.issueNumber | 1 | en_US |
dc.citation.spage | 289 | en_US |
dc.citation.volumeNumber | 5 | en_US |
dc.contributor.author | Baykara, M. Z. | en_US |
dc.contributor.author | Schwarz, U. D. | en_US |
dc.date.accessioned | 2018-04-12T13:43:01Z | |
dc.date.available | 2018-04-12T13:43:01Z | |
dc.date.issued | 2014 | en_US |
dc.department | Department of Mechanical Engineering | en_US |
dc.department | Institute of Materials Science and Nanotechnology (UNAM) | en_US |
dc.description.provenance | Made available in DSpace on 2018-04-12T13:43:01Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 179475 bytes, checksum: ea0bedeb05ac9ccfb983c327e155f0c2 (MD5) Previous issue date: 2014 | en_US |
dc.identifier.doi | 10.3762/bjnano.5.31 | en_US |
dc.identifier.issn | 2190-4286 | |
dc.identifier.uri | http://hdl.handle.net/11693/38017 | |
dc.language.iso | English | en_US |
dc.publisher | Beilstein-Institut Zur Forderung der Chemischen Wissenschaften | en_US |
dc.relation.isversionof | http://dx.doi.org/10.3762/bjnano.5.31 | en_US |
dc.source.title | Beilstein Journal of Nanotechnology | en_US |
dc.subject | Atomic force microscopy | en_US |
dc.subject | Scanning force microscopy | en_US |
dc.title | Noncontact atomic force microscopy II | en_US |
dc.type | Article | en_US |
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