Control of the Responsivity and the detectivity of superconductive edge-transition YBa2Cu3O7-x bolometers through substrate properties
dc.citation.epage | 4742 | en_US |
dc.citation.issueNumber | 22 | en_US |
dc.citation.spage | 4735 | en_US |
dc.citation.volumeNumber | 38 | en_US |
dc.contributor.author | Fardmanesh, M. | en_US |
dc.contributor.author | Scoles, K. J. | en_US |
dc.contributor.author | Rothwarf, A. | en_US |
dc.date.accessioned | 2015-07-28T11:56:52Z | |
dc.date.available | 2015-07-28T11:56:52Z | |
dc.date.issued | 1999-08-01 | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.description.abstract | The detectivity D* limits of YBa2Cu3O7-x bolometer on 0.05-cm-thick crystalline substrates are investigated, and a method to increase D* to greater than 10(9) (cm Hz(1/2))/W at a 20-mu m wavelength is proposed. Because the response increases proportionally with the bias current I-b, whereas the noise near T-c (the transition or critical temperature) of our MgO and SrTiO3 substrate samples does not, an increase in D* of these samples is obtained by an increase in I-b. Another limiting factor is the de thermal conductance G(0) of the device, which, although controlled by the substrate-holder thermal boundary resistance for our samples, can be changed by means of thinning the substrate to increase D*. The optimal amount of thinning depends on the substrate's thermal parameters and the radiation modulation frequency. D* in our samples is also found to follow the spectral-radiation absorption of the substrate material. | en_US |
dc.description.provenance | Made available in DSpace on 2015-07-28T11:56:52Z (GMT). No. of bitstreams: 1 10.1364-AO.38.004735.pdf: 143955 bytes, checksum: 823aebe59109ffa7953c8d1fc70b95de (MD5) | en |
dc.identifier.doi | 10.1364/AO.38.004735 | en_US |
dc.identifier.issn | 0003-6935 | |
dc.identifier.uri | http://hdl.handle.net/11693/11102 | |
dc.language.iso | English | en_US |
dc.publisher | Optical Society of America | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1364/AO.38.004735 | en_US |
dc.source.title | Applied Optics | en_US |
dc.subject | Thin-film | en_US |
dc.subject | Microbolometer | en_US |
dc.subject | Frequency | en_US |
dc.subject | Interface | en_US |
dc.subject | Phase | en_US |
dc.title | Control of the Responsivity and the detectivity of superconductive edge-transition YBa2Cu3O7-x bolometers through substrate properties | en_US |
dc.type | Article | en_US |
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