Control of the Responsivity and the detectivity of superconductive edge-transition YBa2Cu3O7-x bolometers through substrate properties

Fardmanesh, M.
Scoles, K. J.
Rothwarf, A.
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Optical Society of America

The detectivity D* limits of YBa2Cu3O7-x bolometer on 0.05-cm-thick crystalline substrates are investigated, and a method to increase D* to greater than 10(9) (cm Hz(1/2))/W at a 20-mu m wavelength is proposed. Because the response increases proportionally with the bias current I-b, whereas the noise near T-c (the transition or critical temperature) of our MgO and SrTiO3 substrate samples does not, an increase in D* of these samples is obtained by an increase in I-b. Another limiting factor is the de thermal conductance G(0) of the device, which, although controlled by the substrate-holder thermal boundary resistance for our samples, can be changed by means of thinning the substrate to increase D*. The optimal amount of thinning depends on the substrate's thermal parameters and the radiation modulation frequency. D* in our samples is also found to follow the spectral-radiation absorption of the substrate material.

Thin-film, Microbolometer, Frequency, Interface, Phase