Phase imaging in reflection with the acoustic microscope

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buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage793en_US
dc.citation.issueNumber12en_US
dc.citation.spage791en_US
dc.citation.volumeNumber31en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.contributor.authorQuate, C. F.en_US
dc.contributor.authorWickramasinghe, H. K.en_US
dc.date.accessioned2019-03-27T13:35:18Z
dc.date.available2019-03-27T13:35:18Z
dc.date.issued1978-01en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractWhen a polished surface of a single crystal is examined with a converging acoustic beam the reflected signal has a characteristic response that is dependent upon the elastic properties of the reflecting surface. This property can be used in the acoustic microscope to monitor the thickness of layers deposited on these surfaces and the small‐scale variations of the elastic parameters in these materials.en_US
dc.description.provenanceSubmitted by Taner Korkmaz (tanerkorkmaz@bilkent.edu.tr) on 2019-03-27T13:35:18Z No. of bitstreams: 1 Phase_imaging_in_reflection_with_the_acoustic_microscope.pdf: 294360 bytes, checksum: fa8a631fb956bc8e541a0cc0f4664ded (MD5)en
dc.description.provenanceMade available in DSpace on 2019-03-27T13:35:18Z (GMT). No. of bitstreams: 1 Phase_imaging_in_reflection_with_the_acoustic_microscope.pdf: 294360 bytes, checksum: fa8a631fb956bc8e541a0cc0f4664ded (MD5) Previous issue date: 1978-01en
dc.identifier.doi10.1063/1.89551en_US
dc.identifier.eissn1077-3118
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/11693/50726
dc.language.isoEnglishen_US
dc.publisherA I P Publishingen_US
dc.relation.isversionofhttps://doi.org/10.1063/1.89551en_US
dc.source.titleApplied Physics Lettersen_US
dc.subjectAcousticsen_US
dc.subjectElasticityen_US
dc.subjectPhase contrast microscopyen_US
dc.titlePhase imaging in reflection with the acoustic microscopeen_US
dc.typeArticleen_US

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