Phase imaging in reflection with the acoustic microscope

Date

1978-01

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Source Title

Applied Physics Letters

Print ISSN

0003-6951

Electronic ISSN

1077-3118

Publisher

A I P Publishing

Volume

31

Issue

12

Pages

791 - 793

Language

English

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Abstract

When a polished surface of a single crystal is examined with a converging acoustic beam the reflected signal has a characteristic response that is dependent upon the elastic properties of the reflecting surface. This property can be used in the acoustic microscope to monitor the thickness of layers deposited on these surfaces and the small‐scale variations of the elastic parameters in these materials.

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