Preface
| buir.contributor.author | Kasırga, Talip Serkan | |
| dc.citation.epage | viii | en_US |
| dc.citation.spage | vii | en_US |
| dc.contributor.author | Kasırga, Talip Serkan | |
| dc.date.accessioned | 2021-03-05T17:08:56Z | |
| dc.date.available | 2021-03-05T17:08:56Z | |
| dc.date.issued | 2020 | |
| dc.department | Department of Physics | en_US |
| dc.department | Institute of Materials Science and Nanotechnology (UNAM) | en_US |
| dc.identifier.issn | 2191-530X | |
| dc.identifier.uri | http://hdl.handle.net/11693/75850 | |
| dc.language.iso | English | en_US |
| dc.publisher | Springer | en_US |
| dc.relation.ispartof | Thermal conductivity measurements in atomically thin materials and devices | en_US |
| dc.relation.ispartofseries | SpringerBriefs in Applied Sciences and Technology | en_US |
| dc.source.title | SpringerBriefs in Applied Sciences and Technology | en_US |
| dc.title | Preface | en_US |
| dc.type | Editorial | en_US |
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