High throughput, high resolution scanning probe microscopy

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buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage263en_US
dc.citation.issueNumber6en_US
dc.citation.spage259en_US
dc.contributor.authorAdams, J. D.en_US
dc.contributor.authorMinne, S. C.en_US
dc.contributor.authorManalis, S. R.en_US
dc.contributor.authorWilder, K.en_US
dc.contributor.authorYaralioglu, G.en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.contributor.authorAdderton, D.en_US
dc.contributor.authorQuate, C. F.en_US
dc.date.accessioned2019-03-27T18:24:35Z
dc.date.available2019-03-27T18:24:35Z
dc.date.issued1998en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.identifier.urihttp://hdl.handle.net/11693/50746
dc.language.isoEnglishen_US
dc.publisherTechnology Publishing Ltd.
dc.source.titleFuture Fab Internationalen_US
dc.titleHigh throughput, high resolution scanning probe microscopyen_US
dc.typeArticleen_US

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