CVD grown 2D MoS2 layers: a photoluminescence and fluorescence lifetime imaging study

Date
2016
Authors
Özden, A.
Şar, H.
Yeltik A.
Madenoğlu, B.
Sevik, C.
Ay, F.
Perkgöz, N. K.
Advisor
Instructor
Source Title
Physica Status Solidi - Rapid Research Letters
Print ISSN
1862-6254
Electronic ISSN
Publisher
Wiley-VCH Verlag
Volume
10
Issue
11
Pages
792 - 796
Language
English
Type
Article
Journal Title
Journal ISSN
Volume Title
Abstract

In this letter, we report on the fluorescence lifetime imaging and accompanying photoluminescence properties of a chemical vapour deposition (CVD) grown atomically thin material, MoS2. µ-Raman, µ-photoluminescence (PL) and fluorescence lifetime imaging microscopy (FLIM) are utilized to probe the fluorescence lifetime and photoluminescence properties of individual flakes of MoS2 films. Usage of these three techniques allows identification of the grown layers, grain boundaries, structural defects and their relative effects on the PL and fluorescence lifetime spectra. Our investigation on individual monolayer flakes reveals a clear increase of the fluorescence lifetime from 0.3 ns to 0.45 ns at the edges with respect to interior region. On the other hand, investigation of the film layer reveals quenching of PL intensity and lifetime at the grain boundaries. These results could be important for applications where the activity of edges is important such as in photocatalytic water splitting. Finally, it has been demonstrated that PL mapping and FLIM are viable techniques for the investigation of the grain-boundaries. (Figure presented.). © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Course
Other identifiers
Book Title
Keywords
Chemical vapor deposition, Fluorescence lifetime imaging microscopy, MoS2, Photoluminescence, Raman spectroscopy, Two-dimensional materials
Citation
Published Version (Please cite this version)