Quantitative atom-resolved force gradient imaging using non contact-AFM/STM
| dc.citation.epage | 1917 | en_US |
| dc.citation.issueNumber | 12 | en_US |
| dc.citation.spage | 1915 | en_US |
| dc.citation.volumeNumber | 79 | en_US |
| dc.contributor.author | Oral, A. | en_US |
| dc.contributor.author | Grimble, R. A. | en_US |
| dc.contributor.author | Ozer, H. O. | en_US |
| dc.contributor.author | Hoffman, P. M. | en_US |
| dc.contributor.author | Pethica, J. B. | en_US |
| dc.date.accessioned | 2015-07-28T11:56:23Z | |
| dc.date.available | 2015-07-28T11:56:23Z | |
| dc.date.issued | 2001 | en_US |
| dc.department | Department of Physics | en_US |
| dc.description.abstract | Quantitative force gradient images are obtained using a sub-angstrom amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale. (C) 2001 American Institute of Physics. | en_US |
| dc.description.provenance | Made available in DSpace on 2015-07-28T11:56:23Z (GMT). No. of bitstreams: 1 10.1063-1.1389785.pdf: 482448 bytes, checksum: c3198d9c755fc1fe00c0fc972347ef46 (MD5) | en |
| dc.identifier.doi | 10.1063/1.1389785 | en_US |
| dc.identifier.issn | 0003-6951 | |
| dc.identifier.uri | http://hdl.handle.net/11693/10944 | |
| dc.language.iso | English | en_US |
| dc.publisher | American Institute of Physics | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1063/1.1389785 | en_US |
| dc.source.title | Applied Physics Letters | en_US |
| dc.subject | Scanning-tunneling-microscopy | en_US |
| dc.subject | Reactive Surfaces | en_US |
| dc.subject | Tip | en_US |
| dc.title | Quantitative atom-resolved force gradient imaging using non contact-AFM/STM | en_US |
| dc.type | Article | en_US |
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