Quantitative atom-resolved force gradient imaging using non contact-AFM/STM

Date

2001

Authors

Oral, A.
Grimble, R. A.
Ozer, H. O.
Hoffman, P. M.
Pethica, J. B.

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Abstract

Quantitative force gradient images are obtained using a sub-angstrom amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale. (C) 2001 American Institute of Physics.

Source Title

Applied Physics Letters

Publisher

American Institute of Physics

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Published Version (Please cite this version)

Language

English