Wafer-scale arrays of high-Q silica optical microcavities
dc.citation.epage | 2493 | en_US |
dc.citation.issueNumber | 9 | en_US |
dc.citation.spage | 2489 | en_US |
dc.citation.volumeNumber | 56 | en_US |
dc.contributor.author | Ozgur E. | en_US |
dc.contributor.author | Huseyinoglu E. | en_US |
dc.contributor.author | Dana, A. | en_US |
dc.date.accessioned | 2018-04-12T11:00:57Z | |
dc.date.available | 2018-04-12T11:00:57Z | |
dc.date.issued | 2017 | en_US |
dc.department | Institute of Materials Science and Nanotechnology (UNAM) | en_US |
dc.description.abstract | On-chip high-Q microcavities possess significant potential in terms of integration of optical microresonators into functional optoelectronic devices that could be used in various applications, including biosensors, photonic-integrated circuits, or quantum optics experiments. Yet, despite the convenience of fabricating wafer-scale integrated microresonators with moderate Q values using standard microfabrication techniques, surface-tension-induced microcavities (STIMs), which have atomic-level surface roughness enabling the observation of Q values larger than 106, could only be produced using individual thermal treatment of every single microresonator within the devised area. Here, we demonstrate a facile method for large-scale fabrication of silica STIMs of various morphologies. Q values exceeding 106 are readily obtained using this technique. This study represents a significant advancement toward fabrication of wafer-scale optoelectronic circuitries. | en_US |
dc.description.provenance | Made available in DSpace on 2018-04-12T11:00:57Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 179475 bytes, checksum: ea0bedeb05ac9ccfb983c327e155f0c2 (MD5) Previous issue date: 2017 | en |
dc.identifier.doi | 10.1364/AO.56.002489 | en_US |
dc.identifier.issn | 1559-128X | |
dc.identifier.uri | http://hdl.handle.net/11693/37037 | |
dc.language.iso | English | en_US |
dc.publisher | OSA - The Optical Society | en_US |
dc.relation.isversionof | https://doi.org/10.1364/AO.56.002489 | en_US |
dc.source.title | Applied Optics | en_US |
dc.subject | Microcavities | en_US |
dc.subject | Optoelectronic devices | en_US |
dc.subject | Photonic devices | en_US |
dc.subject | Quantum optics | en_US |
dc.subject | Resonators | en_US |
dc.subject | Silica | en_US |
dc.subject | Surface roughness | en_US |
dc.subject | Atomic levels | en_US |
dc.subject | High-Q microcavity | en_US |
dc.subject | Large-scale fabrication | en_US |
dc.subject | Micro resonators | en_US |
dc.subject | Micro-fabrication techniques | en_US |
dc.subject | Optical microcavities | en_US |
dc.subject | Optical microresonators | en_US |
dc.subject | Photonic integrated circuits | en_US |
dc.subject | WSI circuits | en_US |
dc.title | Wafer-scale arrays of high-Q silica optical microcavities | en_US |
dc.type | Article | en_US |
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