XPS and in-situ IR investigation of Ru/SiO2 catalyst
| dc.citation.epage | 114 | en_US |
| dc.citation.spage | 111 | en_US |
| dc.citation.volumeNumber | 410-411 | en_US |
| dc.contributor.author | Sayan, Ş. | en_US |
| dc.contributor.author | Süzer, S. | en_US |
| dc.contributor.author | Uner, D. O. | en_US |
| dc.date.accessioned | 2015-07-28T11:56:09Z | |
| dc.date.available | 2015-07-28T11:56:09Z | |
| dc.date.issued | 1997-06-16 | en_US |
| dc.department | Department of Chemistry | en_US |
| dc.description.abstract | Ru(NO)(N0&/Si02 catalyst precursors were characterized via XPS and in-situ reflectance IR spectroscopy before, during and after reduction by hydrogen over the temperature range 300-800 K. IR results indicated that the catalyst precursor lost NO3 groups first, with subsequent loss of NO both in a reducing atmosphere and during thermal annealing. XPS was used to derive information on the oxidation state of Ru in the various steps of the annealing and/or reduction processes. 0 1997 Elsevier Science B.V. | en_US |
| dc.description.provenance | Made available in DSpace on 2015-07-28T11:56:09Z (GMT). No. of bitstreams: 1 10.1016-S0022-2860(96)09637-8.pdf: 272284 bytes, checksum: 19e9c8cc2f968db4817232ddd019c953 (MD5) | en |
| dc.identifier.doi | 10.1016/S0022-2860(96)09637-8 | en_US |
| dc.identifier.issn | 0022-2860 | |
| dc.identifier.uri | http://hdl.handle.net/11693/10875 | |
| dc.language.iso | English | en_US |
| dc.publisher | Elsevier | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1016/S0022-2860(96)09637-8 | en_US |
| dc.source.title | Journal of Molecular Structure | en_US |
| dc.subject | Ru catalyst | en_US |
| dc.subject | XPS | en_US |
| dc.subject | In-situ IR | en_US |
| dc.title | XPS and in-situ IR investigation of Ru/SiO2 catalyst | en_US |
| dc.type | Article | en_US |
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