XPS and in-situ IR investigation of Ru/SiO2 catalyst
Date
1997-06-16
Authors
Sayan, Ş.
Süzer, S.
Uner, D. O.
Editor(s)
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
Source Title
Journal of Molecular Structure
Print ISSN
0022-2860
Electronic ISSN
Publisher
Elsevier
Volume
410-411
Issue
Pages
111 - 114
Language
English
Type
Journal Title
Journal ISSN
Volume Title
Series
Abstract
Ru(NO)(N0&/Si02 catalyst precursors were characterized via XPS and in-situ reflectance IR spectroscopy before, during and after reduction by hydrogen over the temperature range 300-800 K. IR results indicated that the catalyst precursor lost NO3 groups first, with subsequent loss of NO both in a reducing atmosphere and during thermal annealing. XPS was used to derive information on the oxidation state of Ru in the various steps of the annealing and/or reduction processes. 0 1997 Elsevier Science B.V.