Browsing by Subject "Valence band offset"

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    Soft x-ray photoemission studies of Hf oxidation
    (A I P Publishing LLC, 2003) Süzer, Şefik; Sayan, S.; Banaszak Holl, M. M.; Garfunkel, E.; Hussain, Z.; Hamdan, N. M.
    Charging of oxide films under x rays is an important issue that must be taken into consideration for determination of core-level binding energies as well as valence band offsets. Measurements are taken as a function of time, thickness, and annealing condition. Photoemission results show the presence of metallic Hf with the 4f7/2 binding energy of 18.16 eV, and at least one clear suboxide peak.