Browsing by Subject "VLSI technology"

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    Blind data detection in the presence of PLL phase noise by sequential Monte Carlo method
    (IEEE, 2006-06) Panayırcı, Erdal; Çırpan H. A.; Moeneclaey, M.; Noels, N.
    In this paper, based on a sequential Monte Carlo method, a computationally efficient algorithm is presented for blind data detection in the presence of residual phase noise generated at the output the phase tracking loop employed in a digital receiver. The basic idea is to treat the transmitted symbols as" missing data" and draw samples sequentially of them based on the observed signal samples up to time t. This way, the Bayesian estimates of the phase noise and the incoming data are obtained through these samples, sequentially drawn,together with their importance weights. The proposed receiver structure is seen to be ideally suited for high-speed parallel implementation using VLSI technology. © 2006 IEEE.
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    Silicon-Germanium multi-quantum well photodetectors in the near infrared
    (Optical Society of American (OSA), 2012) Onaran, E.; Onbasli, M. C.; Yesilyurt, A.; Yu, H. Y.; Nayfeh, A. M.; Okyay, Ali Kemal
    Single crystal Silicon-Germanium multi-quantum well layers were epitaxially grown on silicon substrates. Very high quality films were achieved with high level of control utilizing recently developed MHAH epitaxial technique. MHAH growth technique facilitates the monolithic integration of photonic functionality such as modulators and photodetectors with low-cost silicon VLSI technology. Mesa structured p-i-n photodetectors were fabricated with low reverse leakage currents of ∼10 mA/cm2 and responsivity values exceeding 0.1 A/W. Moreover, the spectral responsivity of fabricated detectors can be tuned by applied voltage. © 2012 Optical Society of America.