Browsing by Subject "Signal To Noise Ratio"

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    Enhanced higher-harmonic imaging in tapping-mode atomic force microscopy
    (AIP, 2005) Balantekin, M.; Atalar, Abdullah
    Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlinear tip-sample interaction force. The higher harmonics contain important information about the materials’ nanomechanical properties. These harmonics can be significantly enhanced by driving the cantilever close to a submultiple of its resonant frequency. We present the results of enhanced higher-harmonic imaging experiments on several samples. The results indicate that enhanced higher harmonics can be utilized effectively for both material characterization and surface roughness analysis with a high signal-to-noise ratio. © 2005 American Institute of Physics