Enhanced higher-harmonic imaging in tapping-mode atomic force microscopy

Date

2005

Authors

Balantekin, M.
Atalar, Abdullah

Editor(s)

Advisor

Supervisor

Co-Advisor

Co-Supervisor

Instructor

BUIR Usage Stats
2
views
16
downloads

Citation Stats

Attention Stats

Series

Abstract

Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlinear tip-sample interaction force. The higher harmonics contain important information about the materials’ nanomechanical properties. These harmonics can be significantly enhanced by driving the cantilever close to a submultiple of its resonant frequency. We present the results of enhanced higher-harmonic imaging experiments on several samples. The results indicate that enhanced higher harmonics can be utilized effectively for both material characterization and surface roughness analysis with a high signal-to-noise ratio. © 2005 American Institute of Physics

Source Title

Applied Physics Letters

Publisher

AIP

Course

Other identifiers

Book Title

Keywords

Generation, Cantilever, Atomic Force Microscopy, Imaging Techniques, Nanostructured Materials, Signal To Noise Ratio, Surface Roughness, Nanomechanical Properties, Harmonic Analysis

Degree Discipline

Degree Level

Degree Name

Citation

Published Version (Please cite this version)

Language

English