Browsing by Subject "Rf-squid"

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Open Access
1/f Noise characteristics of SEJ Y-Ba-Cu-O Rf-SQUIDs on LaAlO3 substrate and the step structure, film, and temperature dependence
(IEEE, 2001-03) Fardmanesh, M.; Schubert, J.; Akram, R.; Bick, M.; Zhang, Y.; Banzet, M.; Zander, W.; Krause, H. J.; Burkhart, H.; Schilling, M.
Step edge junction (SEJ) rf-SQUID magnetometers and gradiometers were fabricated using PLD Y-Ea-Cu-0 films on LaA10,(100) and SrTi0,(100) substrates. Effects of different step structure and the film properties on the yield, optimal operating temperature, and the l/f noise of the SQUIDs were investigated. The step structure was controlled using various IBE processes. The devices on LaAIO, showed higher sensitivity to the step structure compared to those on SrTiO,. This was due to re-deposition of substrate material at the steps prepared using the conventional IBE process resulting in a very low yield of unstable SQUIDs. High yield of low l/f noise stable SQUIDs was obtained on LaAIO, substrates with sharp steps prepared using an optimized IBE process. A typical l/f noise corner frequency of about lOHz at 77K with two major temperature dependencies was obtained. The temperature dependencies of the l/f noise could be correlated to the junction and the film of washer area of the SQUIDS. The white noise of our devices showed a dependency mainly on the amplitude of the flux to voltage transfer function signal. The operating temperature range of the SQUIDs could be controlled by the step structure and narrowed when the optimal operating temperature range was increased. All the measured junctions of our devices on the modified steps showed RSJ type behavior with a moderate decrease of the R, versus temperature.
Open Access
Junction characteristics and magnetic field dependencies of low noise step edge junction Rf-SQUIDs for unshielded applications
(IEEE, 2003-06) Fardmanesh, Mehdi; Schubert, J.; Akram, Rizwan; Bozbey, Ali; Bick, M.; Banzet, M.; Lomparski, D.; Zander, W.; Zhang, Y.; Krause, H-J.
Step edge grain boundary (GB) junctions and rf-SQUIDs have been made using pulsed laser deposited Y-Ba-Cu-O films on crystalline LaAlO3 substrates. The steps were developed using various ion-beam etching processes resulting in sharp and ramp type step structures. Sharp step based GB junctions showed behavior of serial junctions with resistively shunted junction (RSJ)-like I-V characteristics. The ramped type step structures resulted in relatively high critical current, Ic, junctions and noisy SQUIDs. The sharp steps resulted in low noise rf-SQUIDs with a noise level below 140 fT/Hz12/ down to few Hz at 77 K while measured with conventional tank circuits. The Ic of the junctions and hence the operating temperature range of the SQUIDs made using sharp steps was controlled by both the step height and the junction widths. The junction properties of the SQUIDs were also characterized showing RSJ-like characteristics and magnetic field sensitivities correlated to that of the SQUIDs. Two major low and high background magnetic field sensitivities have been observed for our step edge junctions and the SQUIDs made on sharp steps. High quality step edge junctions with low magnetic field sensitivities made on clean sharp steps resulted in low 1/f noise rf-SQUIDs proper for applications in unshielded environment.
Open Access
Magnetic Field Behavior of YBCO step-edge Josephson junctions in rf-washer SQUIDs
(IEEE, 2001-03) Bick, M.; Schubert, J.; Fardmanesh, M.; Panaitov, G.; Banzet, M.; Zander, W.; Zhang, Y.; Krause, H. J.
he suppression of the critical current in YBCO Josephson junctions by the Earth's magnetic field strongly affects the operation of SQUIDs outside magnetic shielding. Commonly, one observes a modulation of the SQUID fluxvoltage transfer function amplitude, Vsq.pp, with a period of AB,, leading to an increased white flux noise level or unstable SQUID operation. Here, we report on the investigation of AB,., of rf-SQUID sensors based on step edge junctions (SEJ) operated in a flip chip configuration with coplanar resonators with integrated flux concentrators. To investigate the origin of the suppression of Vsq-pp, we opened the SQUID loop of some samples and measured the magnetic field dependence of the critical current I,(B) directly and compared it to VSqJB). It is shown that a junction width in the submicrometer scale is required for operation of the sensors in the Earth's magnetic field.
Open Access
Superconducting and electro-optical thin films prepared by pulsed laser deposition technique
(Elsevier, 2000-12-15) Schubert, J.; Siegert, M.; Fardmanesh, M.; Zander, W.; Prompers, M.; Cuchal, C.; Lisoni, J.; Lei, C. H.
The pulsed laser deposition (PLD) technique is an excellent method to prepare single crystalline complex oxide thin films. We have successfully grown films for the use in HTS SQUID-devices as well as for thin film optical waveguides. The Josephson junction used in the HTS SQUIDs is formed by a step edge type gain boundary junction. The step preparation is a very critical process in the SQUID preparation to achieve reproducible low 1/f noise devices. We have established a new ion beam etching process to achieve clean and steep edges in LaAlO(3) (100) substrates. The 1/f noise of SQUIDs prepared with the new method is drastically reduced. In the process of developing thin film electro-optical waveguide modulators we investigated the influence of different substrates on the optical and structural properties of epitaxial BaTiO(3) thin films. These films are grown on MgO(1 0 0), MgAl(2)O(4)(1 0 0), SrTiO(3)(1 0 0) and MgO buffered Al(2)O(3)(1 (1) over bar 0 2) substrates. The waveguide losses and the refractive indices were measured with a prism coupling setup. The optical data are correlated to the results of Rutherford backscattering spectrometry/ion channeling (RBS/C), X-ray diffraction (XRD), atomic force microscopy (AFM) and transmission electron microscopy (TEM). The dielectric constant, the ferroelectric hysteresis loop and the transition temperature (ferroelectric to paraelectric state) of the BaTiO(3) thin films are measured. (C) 2000 Elsevier Science B.V. All rights reserved.