Browsing by Subject "Monolithically integrated"
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Item Open Access Integrated AlGaN quadruple-band ultraviolet photodetectors(IOP Publishing, 2012-04-27) Gökkavas, M.; Butun, S.; Caban, P.; Strupinski, W.; Özbay, EkmelMonolithically integrated quadruple back-illuminated ultraviolet metalsemiconductormetal photodetectors with four different spectral responsivity bands were demonstrated on each of two different Al xGa 1-xN heterostructures. The average of the full-width at half-maximum (FWHM) of the quantum efficiency peaks was 18.15nm for sample A, which incorporated five 1000nm thick epitaxial layers. In comparison, the average FWHM for sample B was 9.98 nm, which incorporated nine 500nm thick epitaxial layers.Item Open Access On-chip characterization of THz Schottky diodes using non-contact probes(IEEE Computer Society, 2016) Khan, T. M.; Ghobadi, A.; Celik, O.; Caglayan, C.; Bıyıklı, Necmi; Okyay, Ali Kemal; Topalli, K.; Sertel, K.We present non-contact characterization of GaAs Schottky contacts in the 140-220 GHz band. The non-contact probing technique utilizes planar on-chip antennas that are monolithically integrated with the coplanar waveguide environment housing the Schottky diode under test. The diode contact is fabricated through a 6 mask lithographic process with a 5 μm deep-trench under the contact to minimize parasitics and extend operation into the THz band. A quasi-optical link between the VNA ports and on-chip probe antennas enables efficient signal coupling into the test device. The non-contact probe station is calibrated using on-chip quick-offset-short method and the effectiveness of this approach is demonstrated for integrated diodes for under various bias conditions.