Browsing by Subject "Ftir techniques"

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    Electrical and chemical characterization of chemically passivated silicon surfaces
    (IEEE, 2008) Chhabra, B.; Süzer, Şefik; Opila, R. L.; Honsberg, C. B.
    The surface composition of chemically passivated silicon substrates is investigated using XPS and FTIR techniques. The samples are passivated with methanol, quinhydrone-methanol and iodine-methanol solution after HF treatment. The minority carrier lifetimes of these chemically passivated silicon substrates are also measured. Quinhydrone-methanol solution provides a chemically inert surface and a considerably longer minority carrier lifetime.