Browsing by Subject "Electronic equipment testing"
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Item Open Access The design of finite-state machines for quantization using simulated annealing(IEEE, 1993) Kuruoğlu, Ercan Engin; Ayanoğlu, E.In this paper, the combinatorial optimization algorithm known as simulated annealing is used for the optimization of the trellis structure or the next-state map of the decoder finite-state machine in trellis waveform coding. The generalized Lloyd algorithm which finds the optimum codebook is incorporated into simulated annealing. Comparison of simulation results with previous work in the literature shows that this combined method yields coding systems with good performance.Item Open Access Design of multi-octave band GaN-HEMT power amplifier(IEEE, 2012) Eren, Gulesin; Şen, Özlem A.; Bölükbaş, Basar; Kurt, Gökhan; Arıcan, Orkun; Cengiz, Ömer; Ünal, Sıla T.K.; Durmuş, Yıldırım; Özbay, EkmelThis paper describes design, fabrication and measurement of 6 GHz - 18 GHz monolithic microwave integrated circuit (MMIC) amplifier. The amplifier is realized as coplanar waveguide (CPW) circuit using 0.3 μm-gate Gallium-Nitride (GaN) HEMT technology. The amplifier has a small signal gain of 7 ± 0.75 dB. The output power at 3dB compression is better than 24 dBm with 16%-19% drain efficiency for the whole 6 GHz-18 GHz frequency band under continuous wave (CW) power. © 2012 IEEE.