Browsing by Author "Agan, S."
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Item Open Access Infrared luminescence of annealed germanosilicate layers(Elsevier, 2014-03) Tokay, M. S.; Yasar, E.; Agan, S.; Aydınlı, AtillaIn the light of growing importance of semiconductor nanocrystals for photonics, we report on the growth and characterization of annealed germanosilicate layers used for Ge nanocrystal formation. The films are grown using plasma enhanced chemical vapor deposition (PECVD) and post-annealed in nitrogen at temperatures between 600 and 1200 degrees C for as long as 2 h. Transmission electron microscopy (TEM), Raman scattering and photoluminescence spectroscopy (PL) has been used to characterize the samples both structurally and optically. Formation of Ge precipitates in the germanosilicate layers have been observed using Raman spectroscopy for a variety of PECVD growth parameters, annealing temperatures and times. Ge-Ge mode at similar to 300 cm(-1) is clearly observed at temperatures as low as 700 degrees C for annealing durations for 45 min. Raman results indicate that upon annealing for extended periods of time at temperatures above 900 degrees C; nanocrystals of few tens of nanometers in diameter inside the oxide matrix and precipitation and interdiffusion of Ge, forming SiGe alloy at the silicon and oxide interface take place. Low temperature PL spectroscopy has been used to observe luminescence from these samples in the vicinity of 1550 nm, an important wavelength for telecommunications. Observed luminescence quenches at 140 K. The photoluminescence data displays three peaks closely interrelated at approximately 1490,, 1530 and 1610 nm. PL spectra persist even after removing the oxide layer indicating that the origin of the infrared luminescent centers are not related to the Ge nanocrystals in the oxide layer. (C) 2013 Elsevier B.V. All rights reserved.Item Open Access Low-loss as-grown germanosilicate layers for optical waveguides(A I P Publishing LLC, 2003) Ay, F.; Aydınlı, Atilla; Agan, S.We report on systematic growth and characterization of low-loss germanosilicate layers for use in optical waveguide technology. The films were deposited by plasma-enhanced chemical vapor deposition technique using silane, germane, and nitrous oxide as precursor gases. Fourier transform infrared spectroscopy was used to monitor the compositional properties of the samples. It was found that addition of germane leads to decreasing of N-H- and O-H-related bonds. The propagation loss values of the planar waveguides were correlated with the decrease in the hydrogen-related bonds of the as-deposited waveguides and resulted in very low values, eliminating the need for high-temperature annealing as is usually done.Item Open Access Plasma enhanced chemical vapor deposition of low-loss as-grown germanosilicate layers for optical waveguides(SPIE, 2004) Ay, Feridun; Agan, S.; Aydınlı, AtillaWe report on systematic growth and characterization of low-loss germanosilicate layers for use in optical waveguides. Plasma enhanced chemical vapor deposition (PECVD) technique was used to grow the films using silane, germane and nitrous oxide as precursor gases. Chemical composition was monitored by Fourier transform infrared (FTIR) spectroscopy. N-H bond concentration of the films decreased from 0.43 ×1022 cm -3 down to below 0.06x 1022 cm-3, by a factor of seven as the GeH4 flow rate increased from 0 to 70 seem. A simultaneous decrease of O-H related bonds was also observed by a factor of 10 in the same germane flow range. The measured TE loss rates at λ=632.8 nm were found to increase from are 0.20 ± 0.02 to 6.46 ± 0.04 dB/cm as the germane flow rate increased from 5 to 50 seem, respectively. In contrast, the propagation loss values for TE polarization at λ-1550 nm were found to decrease from 0.32 ± 0.03 down to 0.14 ± 0.06 dB/cm for the same samples leading to the lowest values reported so far in the literature, eliminating the need for high temperature annealing as is usually done for these materials to be used in waveguide devices.Item Open Access Prism coupling technique investigation of elasto-optical properties of thin polymer films(American Institute of Physics, 2004) Ay, F.; Kocabas, A.; Kocabas, C.; Aydınlı, Atilla; Agan, S.The use of thin polymer films in optical planar integrated optical circuits is rapidly increasing. Much interest, therefore, has been devoted to characterizing the optical and mechanical properties of thin polymer films. This study focuses on measuring the elasto-optical properties of three different polymers; polystyrene, polymethyl-methacrylate, and benzocyclobutane. The out-of-plane elastic modulus, refractive index, film thickness, and birefringence of thin polymer films were determined by means of the prism coupling technique. The effect of the applied stress on the refractive index and birefringence of the films was investigated. Three-dimensional finite element method analysis was used so as to obtain the principal stresses for each polymer system, and combining them with the stress dependent refractive index measurements, the elasto-optic coefficients of the polymer films were determined. It was found that the applied stress in the out-of-plane direction of the thin films investigated leads to negative elasto-optic coefficients, as observed for all the three thin polymer films.Item Open Access A simple approach for the fabrication of 3D microelectrodes for impedimetric sensing(Institute of Physics Publishing, 2015) Guler, M. T.; Bilican, I.; Agan, S.; Elbuken, C.In this paper, we present a very simple method to fabricate three-dimensional (3D) microelectrodes integrated with microfluidic devices. We form the electrodes by etching a microwire placed across a microchannel. For precise control of the electrode spacing, we employ a hydrodynamic focusing microfluidic device and control the width of the etching solution stream. The focused widths of the etchant solution and the etching time determine the gap formed between the electrodes. Using the same microfluidic device, we can fabricate integrated 3D electrodes with different electrode gaps. We have demonstrated the functionality of these electrodes using an impedimetric particle counting setup. Using 3D microelectrodes with a diameter of 25 μm, we have detected 6 μm-diameter polystyrene beads in a buffer solution as well as erythrocytes in a PBS solution. We study the effect of electrode spacing on the signal-to-noise ratio of the impedance signal and we demonstrate that the smaller the electrode spacing the higher the signal obtained from a single microparticle. The sample stream is introduced to the system using the same hydrodynamic focusing device, which ensures the alignment of the sample in between the electrodes. Utilising a 3D hydrodynamic focusing approach, we force all the particles to go through the sensing region of the electrodes. This fabrication scheme not only provides a very low-cost and easy method for rapid prototyping, but which can also be used for applications requiring 3D electric field focused through a narrow section of the microchannel.Item Open Access Stress effects in prism coupling measurements of thin polymer films(Springer, 2005) Agan, S.; Ay, F.; Kocabas, A.; Aydınlı, AtillaDue to the increasingly important role of some polymers in optical waveguide technologies, precise measurement of their optical properties has become important. Typically, prism coupling to slab waveguides made of materials of interest is used to measure the relevant optical parameters. However, such measurements are often complicated by the softness of the polymer films when stress is applied to the prism to couple light into the waveguides. In this work, we have investigated the optical properties of three different polymers, polystyrene (PS), polymethyl-methacrylate (PMMA), and benzocyclobutane (BCB). For the first time, the dependence of the refractive index, film thickness, and birefringence on applied stress in these thin polymer films was determined by means of the prism coupling technique. Both symmetric trapezoid shaped and right-angle prisms were used to couple the light into the waveguides. It was found that trapezoid shaped prism coupling gives better results in these thin polymer films. The refractive index of PMMA was found to be in the range of 1.4869 up to 1.4876 for both TE and TM polarizations under the applied force, which causes a small decrease in the film thickness of up to 0.06 μm. PMMA waveguide films were found not to be birefringent. In contrast, both BCB and PS films exhibit birefringence albeit of opposing signs.Item Open Access Using nanogap in label-free impedance based electrical biosensors to overcome electrical double layer effect(Springer Verlag, 2017) Okyay, Ali Kemal; Hanoglu, O.; Yuksel, M.; Acar, H.; Sülek, S.; Tekcan, B.; Agan, S.; Bıyıklı, Necmi; Güler, Mustafa O.Point-of-care biosensor applications require low-cost and low-power solutions. They offer being easily accessible at home site. They are usable without any complex sample handling or any kind of special expertise. Impedance spectroscopy has been utilized for point-of-care biosensor applications; however, electrical double layer formed due to ions in the solution of interest has been a challenge, due to shielding of the electric field used for sensing the target molecules. Here in this study, we demonstrate a nanogap based biosensor structure with a relatively low frequency (1–100 kHz) measurement technique, which not only eliminates the undesired shielding effect of electrical double layer but also helps in minimizing the measurement volume and enabling low concentration (µ molar level) detection of target molecules (streptavidin). Repeatability and sensitivity tests proved stable and reliable operation of the sensors. These biosensors might offer attributes such as low-cost label-free detection, fast measurement and monolithic chip integrability.