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      • Faculty of Engineering
      • Department of Electrical and Electronics Engineering
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      Volatile organic compound plume detection using wavelet analysis of video

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      Author
      Töreyin, B. Uğur
      Çetin, A. Enis
      Date
      2008-10
      Source Title
      Proceedings - International Conference on Image Processing, ICIP
      Publisher
      IEEE
      Pages
      1836 - 1839
      Language
      English
      Type
      Conference Paper
      Item Usage Stats
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      Abstract
      A video based method to detect volatile organic compounds (VOC) leaking out of process equipments used in petrochemical refineries is developed. Leaking VOC plume from a damaged component causes edges present in image frames loose their sharpness. This leads to a decrease in the high frequency content of the image. The background of the scene is estimated and decrease of high frequency energy of the scene is monitored using the spatial wavelet transforms of the current and the background images. Plume regions in image frames are analyzed in low-band sub-images, as well. Image frames are compared with their corresponding low-band images. A maximum likelihood estimator (MLE) for adaptive threshold estimation is also developed in this paper. © 2008 IEEE.
      Keywords
      Fugitive emission
      Parameter estimation
      Volatile organic compounds
      Wavelet transform
      Adaptive thresholds
      Background image
      Damaged components
      Fugitive emission
      High frequency
      Image frames
      Maximum likelihood estimator
      Petrochemical refinery
      Plume detection
      Process equipments
      Subimages
      Gas chromatography
      Image processing
      Imaging systems
      Mathematical transformations
      Maximum likelihood estimation
      Parameter estimation
      Volatile organic compounds
      Wavelet analysis
      Wavelet transforms
      Permalink
      http://hdl.handle.net/11693/26780
      Published Version (Please cite this version)
      http://dx.doi.org/10.1109/ICIP.2008.4712135
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      • Department of Electrical and Electronics Engineering 3524
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