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dc.contributor.authorBalantekin, M.en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.date.accessioned2016-02-08T10:23:52Z
dc.date.available2016-02-08T10:23:52Z
dc.date.issued2005-03en_US
dc.identifier.issn1098-0121
dc.identifier.urihttp://hdl.handle.net/11693/24085
dc.description.abstractIn a tapping-mode atomic force microscope, the frequency spectrum of the oscillating cantilever contains higher harmonics at integer multiples of the excitation frequency. When the cantilever oscillates at its fundamental resonance frequency w 1, the high Q-factor damps the amplitudes of the higher harmonics to negligible levels, unless the higher flexural eigenmodes are coincident with those harmonics. One can enhance the nth harmonic by the Q factor when the cantilever is excited at a submultiple of its resonance frequency (w 1/n). Hence, the magnitude of the nth harmonic can be measured easily and it can be utilized to examine the material properties. We show theoretically that the amplitude of enhanced higher harmonic increases monotonically for a range of sample stiffness, if the interaction is dominated by elastic force.en_US
dc.language.isoEnglishen_US
dc.source.titlePhysical Review Ben_US
dc.relation.isversionofhttps://doi.org/10.1103/PhysRevB.71.125416en_US
dc.subjectArticleen_US
dc.subjectAtomic force microscopyen_US
dc.subjectElasticityen_US
dc.subjectFrequency modulationen_US
dc.subjectMathematical analysisen_US
dc.subjectOscillationen_US
dc.titleEnhancing higher harmonics of a tapping cantilever by excitation at a submultiple of its resonance frequencyen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage125416-1en_US
dc.citation.epage125416-6en_US
dc.citation.volumeNumber71en_US
dc.citation.issueNumber12en_US
dc.identifier.doi10.1103/PhysRevB.71.125416en_US
dc.publisherAmerican Physical Societyen_US
buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240en_US


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