Statistics for High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

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High-sensitivity_noncontact_atomic_force_microscope_scanning_tunneling_microscope_(nc_AFM_STM)_operating_at_subangstrom_oscillation_amplitudes_for_atomic_resolution_imaging_and_force_spectroscopy.pdf 9

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