Characterization of layered materials by the lamb wave lens

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buir.contributor.authorAtalar, Abdullah
buir.contributor.authorKöymen, Hayrettin
buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage362en_US
dc.citation.spage359en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.contributor.authorKöymen, Hayrettinen_US
dc.contributor.authorDeğertekin, F. Leventen_US
dc.coverage.spatialHonolulu, HI, USAen_US
dc.date.accessioned2016-02-08T12:02:30Z
dc.date.available2016-02-08T12:02:30Z
dc.date.issued1990en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.descriptionDate of Conference: 4-7 December 1990en_US
dc.descriptionConference Name: 1990 IEEE Ultrasonics Symposiumen_US
dc.description.abstractThe Lamb wave lens is a type of lens that can replace the conventional lens of an acoustic microscope for some applications. When it insonifies a layered solid structure, it excites a single mode in the structure, provided that the frequency is properly adjusted. Measuring the return signal as a function of frequency results in a characteristic curve showing the excited modes. Since the number of excited modes, the frequencies at which they are excited, and the efficiency of excitation are highly dependent on the elastic and physical parameters of the layered solid, a characterization method emerges. The authors describe this characterization method for the layered structures using the Lamb wave lens. Theoretical and experimental results are presented.en_US
dc.identifier.doi10.1109/ULTSYM.1990.171386en_US
dc.identifier.issn0090-5607en_US
dc.identifier.urihttp://hdl.handle.net/11693/27828
dc.language.isoEnglishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttps://doi.org/10.1109/ULTSYM.1990.171386en_US
dc.source.titleProceedings of the 1990 IEEE Ultrasonics Symposiumen_US
dc.subjectLensesen_US
dc.subjectUltrasonic wavesen_US
dc.subjectLamb wave lensesen_US
dc.subjectLamb wavesen_US
dc.subjectLayered materialsen_US
dc.titleCharacterization of layered materials by the lamb wave lensen_US
dc.typeConference Paperen_US

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