Investigation of the effect of thermal cycling on the device performance of YBa2Cu3O7-δ DC-SQUIDs

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dc.citation.epage949en_US
dc.citation.issueNumber10en_US
dc.citation.spage944en_US
dc.citation.volumeNumber20en_US
dc.contributor.authorAvci I.en_US
dc.contributor.authorAlgul, B.P.en_US
dc.contributor.authorBozbey, A.en_US
dc.contributor.authorAkram, R.en_US
dc.contributor.authorTepe, M.en_US
dc.contributor.authorAbukay, D.en_US
dc.date.accessioned2016-02-08T10:12:49Z
dc.date.available2016-02-08T10:12:49Z
dc.date.issued2007en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractWe investigated the effect of thermal cycling on the operational performance of YBa2Cu3O7-δ (YBCO) direct current superconducting quantum interference devices (DC-SQUIDs) fabricated onto 24°SrTiO3 (STO) bicrystal substrates. The devices under investigation consist of directly coupled DC-SQUID magnetometer configurations. Thin films having 200nm thicknesses were deposited by dc-magnetron sputtering and device patterns were made by a standard lithography process and chemical etching. The SQUIDs having 4νm-wide grain boundary Josephson junctions (GBJJs) were characterized by means of critical currents, peak-to-peak output voltages and noise levels, depending on the thermal cycles. In order to achieve a protective layer for the junctions against the undesired effects of thermal cycles and ambient atmosphere during the room temperature storage, the devices were coated with a 400nm thick YBCO layer at room temperature. Since the second layer of amorphous YBCO is completely electrically insulating, it does not affect the operation of the junctions and pick-up coils of magnetometers. This two-layered configuration ensures the protection of the junctions from ambient atmosphere as well as from the effect of water molecules interacting with the film structure during each thermal cycle. © IOP Publishing Ltd.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:12:49Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2007en
dc.identifier.doi10.1088/0953-2048/20/10/008en_US
dc.identifier.issn0953-2048
dc.identifier.urihttp://hdl.handle.net/11693/23362
dc.language.isoEnglishen_US
dc.relation.isversionofhttp://dx.doi.org/10.1088/0953-2048/20/10/008en_US
dc.source.titleSuperconductor Science and Technologyen_US
dc.subjectCritical currentsen_US
dc.subjectEtchingen_US
dc.subjectLithographyen_US
dc.subjectMagnetron sputteringen_US
dc.subjectMolecular interactionsen_US
dc.subjectSQUIDsen_US
dc.subjectSubstratesen_US
dc.subjectThermal cyclingen_US
dc.subjectDC-magnetron sputteringen_US
dc.subjectProtective layersen_US
dc.subjectYttrium barium copper oxidesen_US
dc.titleInvestigation of the effect of thermal cycling on the device performance of YBa2Cu3O7-δ DC-SQUIDsen_US
dc.typeArticleen_US

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