Investigation of the effect of thermal cycling on the device performance of YBa2Cu3O7-δ DC-SQUIDs
dc.citation.epage | 949 | en_US |
dc.citation.issueNumber | 10 | en_US |
dc.citation.spage | 944 | en_US |
dc.citation.volumeNumber | 20 | en_US |
dc.contributor.author | Avci I. | en_US |
dc.contributor.author | Algul, B.P. | en_US |
dc.contributor.author | Bozbey, A. | en_US |
dc.contributor.author | Akram, R. | en_US |
dc.contributor.author | Tepe, M. | en_US |
dc.contributor.author | Abukay, D. | en_US |
dc.date.accessioned | 2016-02-08T10:12:49Z | |
dc.date.available | 2016-02-08T10:12:49Z | |
dc.date.issued | 2007 | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.department | Department of Physics | en_US |
dc.description.abstract | We investigated the effect of thermal cycling on the operational performance of YBa2Cu3O7-δ (YBCO) direct current superconducting quantum interference devices (DC-SQUIDs) fabricated onto 24°SrTiO3 (STO) bicrystal substrates. The devices under investigation consist of directly coupled DC-SQUID magnetometer configurations. Thin films having 200nm thicknesses were deposited by dc-magnetron sputtering and device patterns were made by a standard lithography process and chemical etching. The SQUIDs having 4νm-wide grain boundary Josephson junctions (GBJJs) were characterized by means of critical currents, peak-to-peak output voltages and noise levels, depending on the thermal cycles. In order to achieve a protective layer for the junctions against the undesired effects of thermal cycles and ambient atmosphere during the room temperature storage, the devices were coated with a 400nm thick YBCO layer at room temperature. Since the second layer of amorphous YBCO is completely electrically insulating, it does not affect the operation of the junctions and pick-up coils of magnetometers. This two-layered configuration ensures the protection of the junctions from ambient atmosphere as well as from the effect of water molecules interacting with the film structure during each thermal cycle. © IOP Publishing Ltd. | en_US |
dc.description.provenance | Made available in DSpace on 2016-02-08T10:12:49Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2007 | en |
dc.identifier.doi | 10.1088/0953-2048/20/10/008 | en_US |
dc.identifier.issn | 0953-2048 | |
dc.identifier.uri | http://hdl.handle.net/11693/23362 | |
dc.language.iso | English | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1088/0953-2048/20/10/008 | en_US |
dc.source.title | Superconductor Science and Technology | en_US |
dc.subject | Critical currents | en_US |
dc.subject | Etching | en_US |
dc.subject | Lithography | en_US |
dc.subject | Magnetron sputtering | en_US |
dc.subject | Molecular interactions | en_US |
dc.subject | SQUIDs | en_US |
dc.subject | Substrates | en_US |
dc.subject | Thermal cycling | en_US |
dc.subject | DC-magnetron sputtering | en_US |
dc.subject | Protective layers | en_US |
dc.subject | Yttrium barium copper oxides | en_US |
dc.title | Investigation of the effect of thermal cycling on the device performance of YBa2Cu3O7-δ DC-SQUIDs | en_US |
dc.type | Article | en_US |
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